iPXE
Data Fields
entropy_repetition_count_test Struct Reference

Repetition count test state. More...

#include <entropy.h>

Data Fields

noise_sample_t most_recent_sample
 A = the most recently seen sample value. More...
 
unsigned int repetition_count
 B = the number of times that value A has been seen in a row. More...
 
unsigned int cutoff
 C = the cutoff value above which the repetition test should fail. More...
 

Detailed Description

Repetition count test state.

This is the state for the repetition Count Test defined in ANS X9.82 Part 2 (October 2011 Draft) Section 8.5.2.1.2.

Definition at line 51 of file entropy.h.

Field Documentation

◆ most_recent_sample

noise_sample_t entropy_repetition_count_test::most_recent_sample

A = the most recently seen sample value.

Definition at line 55 of file entropy.h.

◆ repetition_count

unsigned int entropy_repetition_count_test::repetition_count

B = the number of times that value A has been seen in a row.

Definition at line 59 of file entropy.h.

◆ cutoff

unsigned int entropy_repetition_count_test::cutoff

C = the cutoff value above which the repetition test should fail.

Filled in by entropy_init().

Definition at line 65 of file entropy.h.

Referenced by entropy_init().


The documentation for this struct was generated from the following file: