iPXE
entropy_repetition_count_test Struct Reference

Repetition count test state. More...

#include <entropy.h>

Data Fields

noise_sample_t most_recent_sample
 A = the most recently seen sample value.
unsigned int repetition_count
 B = the number of times that value A has been seen in a row.
unsigned int cutoff
 C = the cutoff value above which the repetition test should fail.

Detailed Description

Repetition count test state.

This is the state for the repetition Count Test defined in ANS X9.82 Part 2 (October 2011 Draft) Section 8.5.2.1.2.

Definition at line 52 of file entropy.h.

Field Documentation

◆ most_recent_sample

noise_sample_t entropy_repetition_count_test::most_recent_sample

A = the most recently seen sample value.

Definition at line 56 of file entropy.h.

◆ repetition_count

unsigned int entropy_repetition_count_test::repetition_count

B = the number of times that value A has been seen in a row.

Definition at line 60 of file entropy.h.

◆ cutoff

unsigned int entropy_repetition_count_test::cutoff

C = the cutoff value above which the repetition test should fail.

Filled in by entropy_init().

Definition at line 66 of file entropy.h.

Referenced by entropy_init().


The documentation for this struct was generated from the following file: